DNX–SENS–NV02

Four Quadrant NV-Diamond Quantum Sensor

Four Quadrant NV-Diamond Quantum Sensor

CHF 9’900 per unit

4 quadrant room-temperature diamond sensing hardware for precision magnetic field, temperature, and materials characterization workflows.

4 quadrant room-temperature diamond sensing hardware for precision magnetic field, temperature, and materials characterization workflows.

• Four independently controlled sensing zones

• Independent microwave and RF control

• Pulsed-measurement capability

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Product overview

Product overview

Multi-zone precision sensing at atomic scale

The DNX–SENS–NV02 Four-Zone NV-Diamond Quantum Sensor is designed for laboratory, industrial and advanced-research teams requiring spatially resolved magnetic-field, temperature and materials measurements without cryogenic infrastructure. A 10 mm × 10 mm NV-diamond sensing plate is combined with four independently addressable sensing zones, enabling simultaneous, sequential or comparative measurements across multiple locations on the same diamond.

Each zone incorporates Dynex’s proprietary nested-loop excitation architecture, with dedicated microwave and RF structures for electronic- and nuclear-spin control. The compact loop geometry replaces a conventional large ring resonator, producing localized excitation fields while preserving independent control of the four measurement zones.

The platform supports multi-point magnetic-field mapping, thermal-gradient measurements, materials characterization, current-distribution analysis and advanced pulsed-ODMR workflows. Its modular RF architecture is designed for integration with external microwave sources, pulse generators, RFSoC systems, lock-in amplifiers and optical acquisition hardware.

Parameters

Parameter

Specification

Sensor type

Four-zone NV-diamond quantum sensor

Sensing platform

Solid-state nitrogen-vacancy diamond

Diamond size

10 mm × 10 mm

Independently addressable zones

4

Operating principle

Optically detected magnetic resonance

Operating environment

Room temperature

Measurement capabilities

Magnetic field, temperature and materials characterization

Zone arrangement

Four sensing regions distributed across one diamond plate

Local excitation hotspot

Approximately 1.5 mm × 1.5 mm per zone

Microwave control

Independent microwave loop for each zone

RF control

Independent RF loop for each zone

Total excitation channels

8

Microwave inputs

4 independently addressable 50 Ω ports

RF inputs

4 independently addressable 50 Ω ports

Supported measurement modes

Continuous-wave, modulated and pulsed ODMR

Optical readout

Zone-selective NV photoluminescence detection

Proprietary Excitation Architecture

Parameter

Specification

Architecture

Nested microwave and RF current-loop structure

Microwave-loop position

Inner loop

Microwave-loop dimensions

2.6 mm × 2.6 mm

RF-loop position

Outer loop surrounding microwave loop

RF-loop dimensions

3.5 mm × 3.5 mm

Feed architecture

50 Ω transmission line

Simulated input impedance

Approximately 47 Ω

Return path

Via-connected bottom ground plane

Microwave design range

2.0–4.0 GHz simulated

Primary NV operating frequency

Approximately 2.87 GHz

RF operating range evaluated

100 kHz–20 MHz

Substrate

Transparent quartz glass

Substrate thickness

0.5 mm

Quartz dielectric constant

Approximately 3.8

Quartz optical transmission

Greater than 90%

The inner microwave loop provides localized excitation near the NV zero-field-splitting frequency, while the surrounding RF loop supports lower-frequency spin-control and experimental protocols. Both structures use dedicated feed lines and ground returns, providing independent control of every zone.

The transparent quartz substrate supports optical access through the sensing assembly while providing suitable dielectric properties for both microwave and RF structures.

Simulated Excitation Performance

Parameter

Specification

Microwave field-map frequency

2.87 GHz

Microwave excitation power used in simulation

1 W per active port

Minimum microwave field in modeled hotspot

Approximately 16.5 A/m

Equivalent microwave B₁ field

Approximately 0.2 G

Typical microwave isolation between zones

30–35 dB

Lowest simulated adjacent-zone isolation

Approximately 20 dB

RF excitation power used in simulation

1 W per active port

Simulated RF magnetic field

Approximately 36.5 A/m

Equivalent RF B₁ field

Approximately 0.46 G

RF frequency response

Broadband across 100 kHz–20 MHz

The microwave simulations show localized excitation of the selected zone at 2.87 GHz, with the remaining zones receiving substantially reduced field intensity. Typical simulated isolation between microwave channels is approximately 30–35 dB.

The RF-loop structure remains comparatively constant across the evaluated 100 kHz to 20 MHz range, supporting broadband control rather than operation at only one narrow resonant frequency.

NV-Diamond Characterization

Parameter

Specification

Diamond format

10 mm × 10 mm NV-diamond plate

Optical characterization

Photoluminescence spectrum

Spin-resonance characterization

Continuous-wave ODMR

Coherence characterization

Hahn-echo measurement

Measured Hahn-echo coherence time

Approximately 350 µs

ODMR response

Multiple resolved resonance features

Supported workflows

CW ODMR, bias-field measurements and pulsed spin experiments

The diamond characterization includes photoluminescence spectroscopy, continuous-wave ODMR under bias field and Hahn-echo coherence measurements:

Integrated Optical Detection

Parameter

Specification

Detector material

Silicon

Detector architecture

Reverse-biased PIN photodiode with fixed-gain transimpedance amplifier

Active area

Ø 1.0 mm / 0.8 mm²

Wavelength range

200–1100 nm

Peak response wavelength

730 nm, typical

Peak responsivity

0.44 A/W, typical

Small-signal bandwidth

150 MHz

Rise time

2.3 ns

Noise-equivalent power

2.92 × 10⁻¹¹ W/√Hz

Output noise

1.5 mV RMS

Maximum dark offset

±10 mV

Maximum output current

100 mA

Supported load impedance

50 Ω to high impedance

Transimpedance gain at 50 Ω

5 × 10³ V/A, ±2%

Transimpedance gain at high impedance

1 × 10⁴ V/A, ±2%

Output voltage at 50 Ω

0–5 V

Output voltage at high impedance

0–10 V

Detector-stage supply

+12 VDC / ground / −12 VDC

Detector operating temperature

10–40 °C

Detector storage temperature

−20–70 °C

The integrated optical detectors support visible and near-infrared fluorescence monitoring over a 200–1100 nm wavelength range. Its buffered output can drive either 50 Ω or high-impedance acquisition inputs, with output ranges of 0–5 V and 0–10 V respectively.

Key Features

Four independently controlled sensing zones
The four-zone architecture enables comparative measurements, spatial-gradient sensing and localized excitation without mechanically repositioning the diamond.

Room-temperature quantum sensing
NV centers retain optically readable spin properties at room temperature, removing the need for cryogenic cooling infrastructure.

Independent microwave and RF control
Each sensing zone has a dedicated microwave loop and a dedicated RF loop, providing eight individually addressable excitation channels.

Localized microwave excitation
The compact inner-loop geometry concentrates the microwave field within the intended sensing region while reducing excitation of neighbouring zones.

Broadband RF capability
The surrounding RF loops support control signals from approximately 100 kHz to 20 MHz, enabling nuclear-spin manipulation, low-frequency excitation and advanced pulse sequences.

Transparent quartz architecture
The quartz-glass substrate permits optical access to the NV diamond while supporting microwave and RF routing beneath the sensing surface.

Multi-point measurement workflows
Four sensing regions can be used to compare local magnetic fields, temperature gradients or material responses within one synchronized experimental platform.

Pulsed-measurement capability
The combination of microwave control, broadband RF excitation and demonstrated Hahn-echo coherence supports advanced spin-manipulation and coherence-based sensing protocols.

Applications
  • Multi-point magnetic-field measurement

  • Magnetic-field-gradient mapping

  • Current-density and conductor diagnostics

  • Temperature and thermal-gradient sensing

  • Advanced materials characterization

  • Semiconductor and electronic-device diagnostics

  • Battery and energy-storage research

  • Biomedical and surface-field measurements

  • Pulsed ODMR and spin-coherence experiments

  • Quantum-sensing research and instrumentation